Brief Introduction :

FTS2000 electronic device aging test system is developed for various discrete components (diode, transistor), power module, relay, contactor and other electronic devices and products dynamic aging test, reliability test, performance index test and other applications. The system has high precision DC power supply and electronic load, with all kinds of high and low temperature test chamber and test instruments, can realize the accelerated aging test of components.

The test system is easy to operate, which can dynamically power up, load and control many electronic devices in batches at the same time, and carry out long-term and continuous test control and data statistical analysis.

The system architecture has good scalability, high configuration flexibility, and can provide customized test items to help all kinds of users easily complete complex experiments.

Main features :

1. High precision of voltage and current;

2. Open software, hardware equipment can be increased, adjusted and configured according to the needs;

3. Modular design, easy to maintain;

4. Compact structure design, intelligent quiet fan to ensure heat dissipation;

5. High performance, low ripple noise programmable power supply;

6. Adaptive constant voltage or constant current output, automatic switching working state;

7. Timing control function, can customize each power output size and time work step;

8. Real-time monitoring of channel data, graphical display of equipment information, record and call of test data, export to Excel file and save.

System software :

FTS2000 system provides a set of open software architecture suitable for a wide range of applications according to customer requirements. Users can edit test steps and control single or multiple test devices at the same time.

1. Open software, hardware equipment can be increased, adjusted and configured according to the needs;

2. Can edit the voltage, current and running sequence of each channel power supply to realize complex on-load test;

3. The test data of each test channel can be recorded, and the output curve and Excel data report can be drawn to ensure the traceable test data;

4. Real-time information such as voltage, current and running sequence of each channel can be displayed;

5. Can display each test channel test device model, aging status, aging process, monitoring status, alarm status, device library information, etc., comprehensively reflect the overall process and condition of the system test.

Recommended test instrument :

DC power supply

FTL multiple power supplies

Output range (single machine) : 0 to 600V/0 to 110A/0 to 1500W

FTP300 series :

Output range (single machine) : 0 to 600V/0 to 80A/0 to 1500W

FTP series :

Output range (single machine) : 0 to 1500V/0 to 240A/0 to 6500W

DC electronic load :

FT6100 series

Single machine: 3U/ up to 12CH

Single-channel input range: 0 to 500V/0 to 60A/0 to 1200W

FT6400 series :

Single-channel input range: 0-1200 V/ 0-1200 A/ 0-6 kW

Measuring attachment :

FT8000 series data acquisition and control system

Can provide relay control, voltage measurement, digital IO signal