FTS2000 Electronic device aging test system

FTS2000 electronic device aging test system is developed for various discrete components (diode, transistor), power module, relay, contactor and other electronic devices and products dynamic aging test, reliability test, performance index test and other applications. The system has high precision DC power supply and electronic load, with all kinds of high and low temperature test chamber and test instruments, can realize the accelerated aging test of components.

The test system is easy to operate, which can dynamically power up, load and control many electronic devices in batches at the same time, and carry out long-term and continuous test control and data statistical analysis.

The system architecture has good scalability, high configuration flexibility, and can provide customized test items to help all kinds of users easily complete complex experiments.